Document Detail


The xerographic properties of bi-se amorphous films.
MedLine Citation:
PMID:  20076099     Owner:  NLM     Status:  In-Data-Review    
Abstract/OtherAbstract:
Xerographic properties were measured for vitreous bismuth-selenium films prepared by flash evaporation techniques in the 0-3 at. % Bi range. Optimum sensitivity was observed in the 1.1 at. % Bi region with broad, relatively flat spectral response from 4000 A to beyond 7000 A and quantum gain values of 0.2 to 0.06, respectively, at these wavelengths with fields of 2 x 10(5) V/cm. The variation of initial xerographic discharge rates was also determined as a function of applied field and light intensity. Mechanical flexibility approximately equivalent to that of selenium was indicated.
Authors:
J C Schottmiller; T W Taylor; F W Ryan
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  Applied optics     Volume:  8 Suppl 1     ISSN:  0003-6935     ISO Abbreviation:  Appl Opt     Publication Date:  1969 Jan 
Date Detail:
Created Date:  2010-01-15     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0247660     Medline TA:  Appl Opt     Country:  United States    
Other Details:
Languages:  eng     Pagination:  55-8     Citation Subset:  -    
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