Document Detail


An in situ heating TEM analysis method for an interface reaction.
MedLine Citation:
PMID:  19376815     Owner:  NLM     Status:  PubMed-not-MEDLINE    
Abstract/OtherAbstract:
In order to analyze the thermal property of nano-sized materials, an in situ observation technique that allows highly sensitive energy dispersive x-ray spectroscopic (EDX) analyses and high-resolution in situ heating observation of precision specimens is required. A method for the in situ observation of the interface reaction using an analytical transmission electron microscopy (TEM) and a specimen-heating holder was developed. The specimen holder used in this study was a direct-heating type having a fine tungsten wire heater. For sensitive analyses including an EDX map of composition changes during the interface reaction, a space toward the EDX detector with a take-off angle of 20 degrees was made in the specimen holder. Samples were prepared by attaching a micro-sample directly to the heater using the focused ion beam (FIB) micro-sampling technique. It was confirmed that the sensitive EDX map and electron diffraction analyses were possible during the reaction, and that the resolution of this technique was of the order of 0.223 nm at 550 degrees C.
Authors:
Toshiaki Tanigaki; Katsuji Ito; Yasuhira Nagakubo; Takayuki Asakawa; Takashi Kanemura
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Publication Detail:
Type:  Journal Article     Date:  2009-04-17
Journal Detail:
Title:  Journal of electron microscopy     Volume:  58     ISSN:  1477-9986     ISO Abbreviation:  J Electron Microsc (Tokyo)     Publication Date:  2009 Oct 
Date Detail:
Created Date:  2009-09-18     Completed Date:  2009-12-01     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  7611157     Medline TA:  J Electron Microsc (Tokyo)     Country:  Japan    
Other Details:
Languages:  eng     Pagination:  281-7     Citation Subset:  -    
Affiliation:
Hitachi High-Tech Manufacturing & Service Corporation, 1040 Ichige, Hitachinaka, Ibaraki, Japan. tanigaki-toshiaki@naka.hitachi-hitec.com
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