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An improved half-covered helical cone-beam CT reconstruction algorithm based on localized reconstruction filter.
MedLine Citation:
PMID:  21876280     Owner:  NLM     Status:  In-Data-Review    
Abstract/OtherAbstract:
Traditional helical cone-beam Computed Tomography (CT) is based on the assumption that the entire cross-section of the scanned object is covered by x-rays at each view angle. Because of the size limitation of planar detector, the traditional helical cone-beam CT scanning is restricted when the cross-section of the object is larger than the field of view (FOV) of the CT system. The helical cone-beam CT scanning based on FOV half-covered can almost double the FOV, whose mechanism is simple and the scanning efficiency is the same as that of traditional helical cone-beam CT. During reconstruction, the extended helical cone-beam FDK algorithm (called half-covered helical FDK for short) is developed, and the computational efficiency of this algorithm is high. But the reconstruction image has truncation error. Regarding this problem, this paper extends the idea of 2D local reconstruction to 3D half-covered helical cone-beam CT, and develops an improved half-covered helical cone-beam CT reconstruction algorithm based on localized reconstruction filter. Experimental results indicate that the presented algorithm well solves the truncation error of the half-covered helical FDK algorithm, improves the quality of the reconstruction image. And for the noise projection data, the presented algorithm can suppress noise and get better results. Moreover, the reconstruction time is much less.
Authors:
Jiqiang Guo; Li Zeng; Xiaobing Zou
Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  Journal of X-ray science and technology     Volume:  19     ISSN:  1095-9114     ISO Abbreviation:  J Xray Sci Technol     Publication Date:  2011 Jan 
Date Detail:
Created Date:  2011-08-30     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  9000080     Medline TA:  J Xray Sci Technol     Country:  Netherlands    
Other Details:
Languages:  eng     Pagination:  293-312     Citation Subset:  IM    
Affiliation:
ICT Research Center, Key Laboratory of Optoelectronic Technology and System of the Education Ministry of China, Chongqing University, Chongqing, China College of Optoelectronic Engineering, Chongqing University, Chongqing, China.
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