Document Detail


A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices.
MedLine Citation:
PMID:  21456771     Owner:  NLM     Status:  In-Data-Review    
Abstract/OtherAbstract:
This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.
Authors:
Min-Kyu Joo; Pilsoo Kang; Yongha Kim; Gyu-Tae Kim; Sangtae Kim
Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  The Review of scientific instruments     Volume:  82     ISSN:  1089-7623     ISO Abbreviation:  Rev Sci Instrum     Publication Date:  2011 Mar 
Date Detail:
Created Date:  2011-04-04     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0405571     Medline TA:  Rev Sci Instrum     Country:  United States    
Other Details:
Languages:  eng     Pagination:  034702     Citation Subset:  IM    
Affiliation:
School of Electrical Engineering, Korea University, Seoul 136-701, South KoreaDepartment of Chemical Engineering and Materials Science, University of California Davis, One Shields Avenue, Davis, California 95616, USA.
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine


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