| Wide band interferometry for thickness measurement. | |
| | |
MedLine Citation:
|
PMID: 19461812 Owner: NLM Status: In-Data-Review |
Abstract/OtherAbstract:
|
In this work we present the concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurement method that gains precision when the bandwidth is reduced to an adequate compromise in order to avoid the distortions arising from the material dispersion. The use of the widest possible band is a well established dogma when the highest resolution is desired in distance measurements with white-light interferometry. We will show that the dogma falls when thickness measurements must be carried out due to material dispersion. In fact the precise knowledge of the frequency dependence of the refractive index is essential for adequate thickness retrieval from the optical experiments. The device we present is also useful to obtain the group refractive index that is necessary to calculate the absolute thickness value. As an example, we show the spreading of a silicone oil on a reference surface in real time. |
| | |
Authors:
|
Santiago Costantino; Oscar Martinez; Jorge Torga |
Publication Detail:
|
Type: Journal Article |
Journal Detail:
|
Title: Optics express Volume: 11 ISSN: 1094-4087 ISO Abbreviation: Opt Express Publication Date: 2003 Apr |
Date Detail:
|
Created Date: 2009-05-22 Completed Date: - Revised Date: - |
Medline Journal Info:
|
Nlm Unique ID: 101137103 Medline TA: Opt Express Country: United States |
Other Details:
|
Languages: eng Pagination: 952-7 Citation Subset: - |
Export Citation:
|
APA/MLA Format Download EndNote Download BibTex |
| MeSH Terms | |
Descriptor/Qualifier:
|
|
From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
Previous Document: Measuring properties of superposed light beams carrying different frequencies.
Next Document: The 'Precessions' tooling for polishing and figuring flat, spherical and aspheric surfaces.