Document Detail

Utilization of Photoemission Cross-Section Effects for Monitoring Thin-Film Growth in UHV.
MedLine Citation:
PMID:  16714824     Owner:  NLM     Status:  In-Data-Review    
Given the tunability of synchrotron radiation, photoemission spectroscopy can be used to monitor the growth modes of thin films in UHV. Cross-section effects such as Cooper minima and resonant photoemission can be exploited to maximize the adsorbate signal and minimize that from the substrate. Under favourable circumstances growth can be monitored in real time at coverages of <1%. As an example the growth of Gd on W(110) is investigated.
N P Tucker; R I Blyth; R G White; M H Lee; A W Robinson; S D Barrett
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  Journal of synchrotron radiation     Volume:  2     ISSN:  0909-0495     ISO Abbreviation:  J Synchrotron Radiat     Publication Date:  1995 Sep 
Date Detail:
Created Date:  2006-05-22     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  9888878     Medline TA:  J Synchrotron Radiat     Country:  Denmark    
Other Details:
Languages:  eng     Pagination:  252-5     Citation Subset:  -    
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