Document Detail

On the Use of Simulated Field-Evaporated Specimen Apex Shapes in Atom Probe Tomography Data Reconstruction.
MedLine Citation:
PMID:  23058657     Owner:  NLM     Status:  Publisher    
The ability to accurately reconstruct original spatial positions of field-evaporated ions emitted from a surface is fundamental to the success of atom probe tomography. As such, a clear understanding of the evolution of specimen shape and the resultant ions' trajectories during field evaporation plays an important role in improving reconstruction accuracy. To further this understanding, field-evaporation simulations of a bilayer specimen composed of two materials having an evaporation field difference of 20% were performed. The simulated field-evaporation patterns qualitatively compare favorably with experimental data, which provides confidence in the accuracy of specimen shapes predicted by the simulation. Correlations of known original atom positions with detector hit positions as a function of lateral detector position and evaporated depth were derived from the simulation. These correlations are contrasted with the current state-of-the-art reconstruction method thus outlining limitations of the current methodology. A pair of transformations are defined that take into account field-evaporated specimen shapes, and the resulting radial magnifications, to relate recorded ion positions in detector space to reconstructed atomic positions in specimen space. This novel process, when applied to simulated data, results in approximately a factor of 2 improvement in accuracy for reconstructions of interfaces with unequal fields (most general interfaces). This method is not constrained by the fundamental assumption of a hemispherical specimen shape.
David J Larson; Brian P Geiser; Ty J Prosa; Thomas F Kelly
Related Documents :
23787587 - An optimized photon pair source for quantum circuits.
24784597 - Empirical assessment of the detection efficiency of cr-39 at high proton fluence and a ...
22330297 - Differences in the evolution of surface-microstructured silicon fabricated by femtoseco...
23330567 - Observation of a transient decrease in terahertz conductivity of single-layer graphene ...
11031657 - Generalized variational principle for the time-dependent hartree-fock equations for a s...
20173877 - Single-mode laser tuning from cholesteric elastomers using a "notch" band-gap configura...
Publication Detail:
Type:  JOURNAL ARTICLE     Date:  2012-10-12
Journal Detail:
Title:  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada     Volume:  -     ISSN:  1435-8115     ISO Abbreviation:  Microsc. Microanal.     Publication Date:  2012 Oct 
Date Detail:
Created Date:  2012-10-12     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  9712707     Medline TA:  Microsc Microanal     Country:  -    
Other Details:
Languages:  ENG     Pagination:  1-11     Citation Subset:  -    
Cameca Instruments, Inc., 5500 Nobel Drive, Madison, WI 53711, USA.
Export Citation:
APA/MLA Format     Download EndNote     Download BibTex
MeSH Terms

From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine

Previous Document:  Reduced physical activity associated with work and transport in adults with cystic fibrosis.
Next Document:  G-quadruplex-based ultrasensitive and selective detection of histidine and cysteine.