Document Detail


Upper-limit luminance for the surface-color mode appearance.
MedLine Citation:
PMID:  11059587     Owner:  NLM     Status:  PubMed-not-MEDLINE    
Abstract/OtherAbstract:
A series of experiments were carried out to reveal determinants for the mode of color appearance by measuring the upper-limit luminance of a color chip for the surface-color mode. We used a CRT color monitor to present test and surround stimuli in the surface-color mode. The stimuli were composed of a three-by-three array of color chips on a gray background with a white frame. The observer increased the luminance of a center test color until it just ceased to appear in the surface-color mode. Our results show that this upper-limit luminance was different among test colors, but their brightnesses, calculated from the luminance and brightness/ luminance values, were almost the same and were slightly below the brightness of the white frame. The existence of the surrounding color chips affected the results, but their sizes and spatial arrangements did not. When all of the luminances of the surrounds changed equally, the upper-limit luminances of the test colors for the surface-color mode appearance changed by the same ratio. This result indicates that the brightness of a target was a determinant for selecting the mode of color appearance and that the brightest surround stimulus acted as a cue for determining the judgment.
Authors:
Y Yamauchi; K Uchikawa
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  Journal of the Optical Society of America. A, Optics, image science, and vision     Volume:  17     ISSN:  1084-7529     ISO Abbreviation:  J Opt Soc Am A Opt Image Sci Vis     Publication Date:  2000 Nov 
Date Detail:
Created Date:  2000-11-06     Completed Date:  2000-11-15     Revised Date:  2003-10-31    
Medline Journal Info:
Nlm Unique ID:  9800943     Medline TA:  J Opt Soc Am A Opt Image Sci Vis     Country:  UNITED STATES    
Other Details:
Languages:  eng     Pagination:  1933-41     Citation Subset:  -    
Affiliation:
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Japan.
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