Total internal reflection and evanescent gain. | |
MedLine Citation:
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PMID: 22108990 Owner: NLM Status: In-Data-Review |
Abstract/OtherAbstract:
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Total internal reflection occurs for large angles of incidence, when light is incident from a high-refractive-index medium onto a low-index medium. We consider the situation where the low-index medium is active. By invoking causality in its most fundamental form, we argue that evanescent gain may or may not appear, depending on the analytic and global properties of the permittivity function. For conventional, weak gain media, we show that there is an absolute instability associated with infinite transverse dimensions. This instability can be ignored or eliminated in certain cases, for which evanescent gain prevails. |
Authors:
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Jon Olav Grepstad; Johannes Skaar |
Publication Detail:
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Type: Journal Article |
Journal Detail:
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Title: Optics express Volume: 19 ISSN: 1094-4087 ISO Abbreviation: Opt Express Publication Date: 2011 Oct |
Date Detail:
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Created Date: 2011-11-23 Completed Date: - Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 101137103 Medline TA: Opt Express Country: United States |
Other Details:
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Languages: eng Pagination: 21404-18 Citation Subset: IM |
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MeSH Terms | |
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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