Document Detail

Three-Dimensional Semiconductor Device Investigation Using Focused Ion Beam and Scanning Electron Microscopy Imaging (FIB/SEM Tomography).
MedLine Citation:
PMID:  23347457     Owner:  NLM     Status:  Publisher    
Three-dimensional focused ion beam/scanning electron microscopy (FIB/SEM tomography) is currently an important technique to characterize in 3D a complex semiconductor device or a specific failure. However, the industrial context demands low turnaround time making the technique less useful. To make it more attractive, the following study focuses on a specific methodology going from sample preparation to the final volume reconstruction to reduce the global time analysis while keeping reliable results. The FIB/SEM parameters available will be first analyzed to acquire a relevant dataset in a reasonable time (few hours). Then, a new alignment strategy based on specific alignment marks [using tetraethoxylisane (TEOS) and Pt deposition] is proposed to improve the volume reconstruction speed. These points combined represent a considerable improvement regarding the reliability of the results and the time consumption (gain of factor 3). This method is then applied to various case studies illustrating the benefits of the FIB/SEM tomography technique such as the precise identification of the origin of 3D defects, or the capability to perform a virtual top-down deprocessing on soft material not possible by any mechanical solution.
K Lepinay; F Lorut
Related Documents :
6339517 - Evidence for actin involvement in cardiac z-lines and z-line analogues.
7712177 - Characterization of the association of phospholipase c-delta with alzheimer neurofibril...
18778797 - Polyphenol-induced dissociation of various amyloid fibrils results in a methionine-inde...
11426877 - Comparison of five procedures for the purification of insoluble elastin.
25385657 - Black phosphorus nanoelectromechanical resonators vibrating at very high frequencies.
14611297 - Tailor-made electronic and magnetic properties in one-dimensional pure and y-substitute...
Publication Detail:
Type:  JOURNAL ARTICLE     Date:  2013-1-25
Journal Detail:
Title:  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada     Volume:  -     ISSN:  1435-8115     ISO Abbreviation:  Microsc. Microanal.     Publication Date:  2013 Jan 
Date Detail:
Created Date:  2013-1-25     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  9712707     Medline TA:  Microsc Microanal     Country:  -    
Other Details:
Languages:  ENG     Pagination:  1-8     Citation Subset:  -    
STMicroelectronics, 850 rue Jean Monnet, F-38926 Crolles, France.
Export Citation:
APA/MLA Format     Download EndNote     Download BibTex
MeSH Terms

From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine

Previous Document:  The Refugee Health Screener-15 (RHS-15): development and validation of an instrument for anxiety, de...
Next Document:  Comparison of serum cystatin C, serum creatinine, measured GFR, and estimated GFR to assess the risk...