| Thermo-optic effect and optical third order nonlinearity in nc-Si embedded in a silicon-nitride film. | |
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MedLine Citation:
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PMID: 18958117 Owner: NLM Status: PubMed-not-MEDLINE |
Abstract/OtherAbstract:
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Using a self-diffraction experiment with 7ns pulses at 532nm we studied a silicon nitride film containing silicon nanoclusters (nc-Si) of 3.1+/-0.37 nm mean size. The sample was prepared by remote plasma-enhanced chemical vapor deposition (RPECVD), and we found that its nonlinearity consists of a combination of electronic and thermal contributions. By varying the repetition rate of the laser, we discriminated the responsible mechanisms for the nonlinear response. Using this procedure we determined a total /chi((3))1111/ = 3.3x10(-10)esu, n2 = 2.7x10(-16) m(2)/W, beta = 1x10(-9) m/W and dn/dT =1x10(-4) degrees C(-1) for our sample. We also show results for the optical Kerr effect using 80 fs pulses at 820 nm. The purely electronic nonlinearity measured is characterized by /chi((3))1111/=9.5 x10(-11) esu. |
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Authors:
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C Torres-Torres; A López-Suárez; L Tamayo-Rivera; R Rangel-Rojo; A Crespo-Sosa; J C Alonso; A Oliver |
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Publication Detail:
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Type: Journal Article; Research Support, Non-U.S. Gov't |
Journal Detail:
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Title: Optics express Volume: 16 ISSN: 1094-4087 ISO Abbreviation: Opt Express Publication Date: 2008 Oct |
Date Detail:
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Created Date: 2008-10-29 Completed Date: 2008-12-08 Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 101137103 Medline TA: Opt Express Country: United States |
Other Details:
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Languages: eng Pagination: 18390-6 Citation Subset: - |
Affiliation:
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Sección de Estudios de Posgrado e Investigación-ESIME-IPN, Zacatenco, México DF, México. crstorres@yahoo.com.mx |
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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