Document Detail


Temperature field analysis of TiO2 films with high-absorptance inclusions.
MedLine Citation:
PMID:  20090796     Owner:  NLM     Status:  PubMed-not-MEDLINE    
Abstract/OtherAbstract:
To deduce the location of absorptive inclusions in thin films, temperature distributions in pure TiO(2) films and TiO(2) films with high-absorptance inclusions are analyzed based on temperature field theory. According to our theoretic simulations, the surface temperature rise increases when absorptive inclusions are incorporated into thin films and shows different values for different inclusions. With the increase of inclusion thickness, the surface temperature rise varies and has a maximum value. A potential method is presented to deduce the location of absorptive inclusion through calculating the surface temperature rise at two modulated frequencies, if it is possible to know in advance the inclusion material or to prejudge this from a thin-film deposition process.
Authors:
Shu-hong Li; Hong-bo He; Da-wei Li; Ming Zhou; Xiu-lan Ling; Yuan-an Zhao; Zheng-xiu Fan
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  Applied optics     Volume:  49     ISSN:  1539-4522     ISO Abbreviation:  Appl Opt     Publication Date:  2010 Jan 
Date Detail:
Created Date:  2010-01-21     Completed Date:  2010-03-22     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0247660     Medline TA:  Appl Opt     Country:  United States    
Other Details:
Languages:  eng     Pagination:  329-33     Citation Subset:  -    
Affiliation:
Key Laboratory of Materials for High Power Lasers, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China.
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