Document Detail


Surface structure of metal-organic framework grown on self-assembled monolayers revealed by high-resolution atomic force microscopy.
MedLine Citation:
PMID:  18850705     Owner:  NLM     Status:  MEDLINE    
Abstract/OtherAbstract:
The surface structure of an individual metal-organic framework (MOF) microcrystal grown on a functionalized surface has been successfully investigated for the first time in air and vacuum using high-resolution atomic force microscopy. Moreover, this detailed surface analysis has been utilized to optimize the MOF formation procedure to obtain a defect-free surface structure. Comparison of obtained data with recent microscopic studies performed on the same MOF crystal but grown by a conventional procedure clearly shows a much higher quality of crystals produced by surface oriented growth. Importantly, this method of preparing crystals suitable for microscopic analysis is also much faster (3 days compared to 2 years) and, in contrast to the conventional method, produces material suitable for in situ study. These results thus demonstrate for the first time the possibility of nanoscale investigation/modification of MOF surface structure.
Authors:
Katarzyna Szelagowska-Kunstman; Piotr Cyganik; Maria Goryl; Denise Zacher; Zita Puterova; Roland A Fischer; Marek Szymonski
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Publication Detail:
Type:  Journal Article; Research Support, Non-U.S. Gov't     Date:  2008-10-14
Journal Detail:
Title:  Journal of the American Chemical Society     Volume:  130     ISSN:  1520-5126     ISO Abbreviation:  J. Am. Chem. Soc.     Publication Date:  2008 Nov 
Date Detail:
Created Date:  2008-10-30     Completed Date:  2008-12-24     Revised Date:  2009-01-27    
Medline Journal Info:
Nlm Unique ID:  7503056     Medline TA:  J Am Chem Soc     Country:  United States    
Other Details:
Languages:  eng     Pagination:  14446-7     Citation Subset:  IM    
Affiliation:
Research Center for Nanometer-Scale Science and Advanced Materials, Faculty of Physics, Astronomy, and Applied Computer Science, Jagiellonian University, 30-059 Kraków, Poland.
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MeSH Terms
Descriptor/Qualifier:
Copper / chemistry*
Crystallization
Microscopy, Atomic Force
Microscopy, Electron, Transmission
Nanoparticles / chemistry
Organometallic Compounds / chemistry*
Silicon / chemistry*
Silicon Dioxide / chemistry*
Surface Properties
Tricarboxylic Acids / chemistry*
Chemical
Reg. No./Substance:
0/Organometallic Compounds; 0/Tricarboxylic Acids; 554-95-0/trimesic acid; 7440-21-3/Silicon; 7440-50-8/Copper; 7631-86-9/Silicon Dioxide

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