Document Detail

Scaling rules for thin-film optical waveguides.
MedLine Citation:
PMID:  20134584     Owner:  NLM     Status:  In-Data-Review    
An asymmetry measure is introduced to characterize thin-film optical waveguides that are asymmetric in refractive index. Together with the usual normalized frequency this allows the plotting of universal charts from which the guide cutoff, the effective guide index, and the effective guide thickness can be determined by the use of simple scaling rules. The minimum value of the effective guide thickness is found to be a simple function of wavelength and the film and substrate indices.
H Kogelnik; V Ramaswamy
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  Applied optics     Volume:  13     ISSN:  0003-6935     ISO Abbreviation:  Appl Opt     Publication Date:  1974 Aug 
Date Detail:
Created Date:  2010-02-05     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0247660     Medline TA:  Appl Opt     Country:  United States    
Other Details:
Languages:  eng     Pagination:  1857-62     Citation Subset:  -    
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine

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