Document Detail


Retrieving depth-direction information from TEM diffraction data under reciprocal-space sampling variation.
MedLine Citation:
PMID:  25461587     Owner:  NLM     Status:  Publisher    
Abstract/OtherAbstract:
For full three-dimensional information retrieval from transmission electron microscope data, retrieving the third-dimension (beam-direction) information is an important challenge. Recently, we have developed an artificial-neural-network-based retrieval algorithm suitable for retrieving three-dimensional nanoscale crystal parameters like strain, including with noisy data (R.S. Pennington, W. Van den Broek, C.T. Koch, Phys. Rev. B 89 (20) (2014) 205409 [12]). In this work, we examine how reciprocal-space sampling conditions influence the retrieved crystal parameters, using crystal tilt as an example parameter, and demonstrate retrieval for 2.5nm depth resolution. For noise-free data, we find that the total reciprocal-space area is the key parameter; however, when the data are noisy, the number of reciprocal-space points and the amount of noise are also influential. We also apply our algorithm to a simulated bent specimen, and recover the bending as expected. Guidelines for experimental applications are also discussed.
Authors:
Robert S Pennington; Christoph T Koch
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Publication Detail:
Type:  JOURNAL ARTICLE     Date:  2014-10-22
Journal Detail:
Title:  Ultramicroscopy     Volume:  148C     ISSN:  1879-2723     ISO Abbreviation:  Ultramicroscopy     Publication Date:  2014 Oct 
Date Detail:
Created Date:  2014-12-2     Completed Date:  -     Revised Date:  2014-12-3    
Medline Journal Info:
Nlm Unique ID:  7513702     Medline TA:  Ultramicroscopy     Country:  -    
Other Details:
Languages:  ENG     Pagination:  105-114     Citation Subset:  -    
Copyright Information:
Copyright © 2014 Elsevier B.V. All rights reserved.
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