Document Detail

Preparation of oxide superconductor specimens for TEM examination.
MedLine Citation:
PMID:  7711328     Owner:  NLM     Status:  MEDLINE    
We have investigated a wide variety of oxide superconductors and report here on a number of techniques that can be effectively used to prepare transmission electron microscopy (TEM) specimens from these materials. Crushing, cleaving, ion milling, ultramicrotomy, and jet polishing all were successfully utilized, and details of each technique, as well as equipment used, are described. Selection among these methods depends both on the starting form of the material and the information required. Ion milling and crushing generally give the best results and have the widest applicability in our particular work, while crushing and cleaving involve the least equipment cost. In some cases, particularly with ion milling and jet polishing, small variations in the details of preparation have a dramatic effect on the success rate. We have found it to be a great advantage that the same techniques can be applied in a similar manner to a whole range of oxide materials, even (with some refinements and special precautions) to those that are extremely oxygen or moisture sensitive.
M Fendorf; M Powers; R Gronsky
Related Documents :
18311618 - Applications and implications of nanotechnologies for the food sector.
17467688 - Analysis of urinary n-acetyl-s-(propionamide)-cysteine as a biomarker for the assessmen...
15722118 - Degradable thiol-acrylate photopolymers: polymerization and degradation behavior of an ...
14504678 - Simultaneous measurement of the maximum oscillation amplitude and the transient decay t...
18379888 - Effect of multiple mating on reproduction and longevity of the phytoseiid mite neoseiul...
12443558 - Comparative analysis of zinc status, food products' frequency intake and food habits of...
Publication Detail:
Type:  Journal Article; Research Support, Non-U.S. Gov't; Review    
Journal Detail:
Title:  Microscopy research and technique     Volume:  30     ISSN:  1059-910X     ISO Abbreviation:  Microsc. Res. Tech.     Publication Date:  1995 Feb 
Date Detail:
Created Date:  1995-05-18     Completed Date:  1995-05-18     Revised Date:  2006-11-15    
Medline Journal Info:
Nlm Unique ID:  9203012     Medline TA:  Microsc Res Tech     Country:  UNITED STATES    
Other Details:
Languages:  eng     Pagination:  167-80     Citation Subset:  IM    
Department of Chemistry, University of California, Berkeley 94720.
Export Citation:
APA/MLA Format     Download EndNote     Download BibTex
MeSH Terms
Electric Conductivity*
Microscopy, Electron / methods*
Microscopy, Electron, Scanning
Oxides / chemistry*
Reg. No./Substance:

From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine

Previous Document:  Direct observations of arrangements of carbonate groups in oxycarbonate superconductors by high-reso...
Next Document:  Shadow images for in-line holography in a STEM instrument.