Document Detail


Preparation of oxide superconductor specimens for TEM examination.
MedLine Citation:
PMID:  7711328     Owner:  NLM     Status:  MEDLINE    
Abstract/OtherAbstract:
We have investigated a wide variety of oxide superconductors and report here on a number of techniques that can be effectively used to prepare transmission electron microscopy (TEM) specimens from these materials. Crushing, cleaving, ion milling, ultramicrotomy, and jet polishing all were successfully utilized, and details of each technique, as well as equipment used, are described. Selection among these methods depends both on the starting form of the material and the information required. Ion milling and crushing generally give the best results and have the widest applicability in our particular work, while crushing and cleaving involve the least equipment cost. In some cases, particularly with ion milling and jet polishing, small variations in the details of preparation have a dramatic effect on the success rate. We have found it to be a great advantage that the same techniques can be applied in a similar manner to a whole range of oxide materials, even (with some refinements and special precautions) to those that are extremely oxygen or moisture sensitive.
Authors:
M Fendorf; M Powers; R Gronsky
Related Documents :
9480688 - Begging signals and biparental care: nestling choice between parental feeding locations
16962888 - Signaling pathways mediating chemotaxis in the social amoeba, dictyostelium discoideum.
11824418 - Soapstone (steatite) cookware as a source of minerals.
19809898 - Effect of high-pressure/temperature (hp/t) treatments of in-package food on additive mi...
16371148 - Purchases of food in youth. influence of price and income.
7864608 - Effects of liquid preloads with different fructose/fibre concentrations on subsequent f...
Publication Detail:
Type:  Journal Article; Research Support, Non-U.S. Gov't; Review    
Journal Detail:
Title:  Microscopy research and technique     Volume:  30     ISSN:  1059-910X     ISO Abbreviation:  Microsc. Res. Tech.     Publication Date:  1995 Feb 
Date Detail:
Created Date:  1995-05-18     Completed Date:  1995-05-18     Revised Date:  2006-11-15    
Medline Journal Info:
Nlm Unique ID:  9203012     Medline TA:  Microsc Res Tech     Country:  UNITED STATES    
Other Details:
Languages:  eng     Pagination:  167-80     Citation Subset:  IM    
Affiliation:
Department of Chemistry, University of California, Berkeley 94720.
Export Citation:
APA/MLA Format     Download EndNote     Download BibTex
MeSH Terms
Descriptor/Qualifier:
Electric Conductivity*
Microscopy, Electron / methods*
Microscopy, Electron, Scanning
Microtomy
Oxides / chemistry*
Chemical
Reg. No./Substance:
0/Oxides

From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine


Previous Document:  Direct observations of arrangements of carbonate groups in oxycarbonate superconductors by high-reso...
Next Document:  Shadow images for in-line holography in a STEM instrument.