Document Detail


Phase detection of electrostatic force by AFM with a conductive tip
MedLine Citation:
PMID:  10741653     Owner:  NLM     Status:  Publisher    
Abstract/OtherAbstract:
Electrostatic force measurements were performed by the Kelvin probe force microscopy, which consists of the atomic force microscopy and a conductive tip. Sample surface potential was evaluated through the electrostatic force, which works between the sample and the tip when we apply an AC bias at a frequency f(s) with a DC offset. If the DC offset voltage is equal to the surface potential difference between the sample and the tip, the amplitude of the f(s) component in the electrostatic force becomes zero, and the phase of the f(s) component jumps 180 degrees there. We found that the complementary use of the amplitude and phase signals improved the accuracy of the determination of the surface potential. We measured both the work functions of some metals and the surface Fermi levels of an InAs layers on (1 0 0) and (1 1 0) GaAs substrates based on the phase detection method of the electrostatic force.
Authors:
Takahashi; Kawamukai
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Publication Detail:
Type:  JOURNAL ARTICLE    
Journal Detail:
Title:  Ultramicroscopy     Volume:  82     ISSN:  1879-2723     ISO Abbreviation:  Ultramicroscopy     Publication Date:  2000 Feb 
Date Detail:
Created Date:  2000-03-29     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  7513702     Medline TA:  Ultramicroscopy     Country:  NETHERLANDS    
Other Details:
Languages:  Eng     Pagination:  63-8     Citation Subset:  -    
Affiliation:
RCAST, University of Tokyo, Japan. takuji@iis.u-tokyo.ac.jp
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