Document Detail

Phase Evolution, Phase Transition, Raman Spectra, Infrared Spectra, and Microwave Dielectric Properties of Low Temperature Firing (K(0.5x)Bi(1-0.5x))(Mo(x)V(1-x))O(4) Ceramics with Scheelite Related Structure.
MedLine Citation:
PMID:  22103679     Owner:  NLM     Status:  Publisher    
In the present work, the (K(0.5x)Bi(1-0.5x))(Mo(x)V(1-x))O(4) ceramics (0≤x ≤ 1.00) were prepared via the solid state reaction method and sintered at temperatures below 830 °C. At room temperature, the BiVO(4) scheelite monoclinic solid solution was formed in ceramic samples with x < 0.10. When x lies between 0.1-0.19, a BiVO(4) scheelite tetragonal phase was formed. The phase transition from scheelite monoclinic to scheelite tetragonal phase is a continuous, second order ferroelastic transition. High temperature X-ray diffraction results showed that this phase transition can also be induced at high temperatures about 62 °C for x = 0.09 sample, and has a monoclinic phase at room temperature. Two scheelite tetragonal phases, one being a BiVO(4) type and the other phase is a (K,Bi)(1/2)MoO(4) type, coexist in the compositional range 0.19 < x < 0.82. A pure (K,Bi)(1/2)MoO(4) tetragonal type solid solution can be obtained in the range 0.82 ≤ x ≤ 0.85. Between 0.88 ≤ x ≤ 1.0, a (K,Bi)(1/2)MoO(4) monoclinic solid solution region was observed. Excellent microwave dielectric performance with a relative dielectric permittivity around 78 and Qf value above 7800 GHz were achieved in ceramic samples near the ferroelastic phase boundary (at x = 0.09 and 0.10).
Di Zhou; Li-Xia Pang; Jing Guo; Hong Wang; Xi Yao; Clive Randall
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Publication Detail:
Type:  JOURNAL ARTICLE     Date:  2011-11-21
Journal Detail:
Title:  Inorganic chemistry     Volume:  -     ISSN:  1520-510X     ISO Abbreviation:  -     Publication Date:  2011 Nov 
Date Detail:
Created Date:  2011-11-22     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0366543     Medline TA:  Inorg Chem     Country:  -    
Other Details:
Languages:  ENG     Pagination:  -     Citation Subset:  -    
Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University , Xi'an 710049, Shaanxi, China.
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