| Observation of double line contrast in surface imaging. | |
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MedLine Citation:
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PMID: 1498355 Owner: NLM Status: MEDLINE |
Abstract/OtherAbstract:
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The double line contrast of a single-atom height step observed in surface imaging for a single crystal in reflection electron microscopy is studied under a variety of experimental conditions. It is suggested that this abnormal contrast is directly associated with the dynamical electron diffraction process. The behavior of the double line contrast is closely related to the order of the Bragg reflected beam, and can be observed mostly under one of the two commonly cited resonance conditions. This phenomenon clearly reveals the differences in the surface imaging for various resonance conditions. |
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Authors:
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N Yao; J M Cowley |
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Publication Detail:
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Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. |
Journal Detail:
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Title: Microscopy research and technique Volume: 20 ISSN: 1059-910X ISO Abbreviation: Microsc. Res. Tech. Publication Date: 1992 Feb |
Date Detail:
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Created Date: 1992-09-17 Completed Date: 1992-09-17 Revised Date: 2006-11-15 |
Medline Journal Info:
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Nlm Unique ID: 9203012 Medline TA: Microsc Res Tech Country: UNITED STATES |
Other Details:
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Languages: eng Pagination: 413-25 Citation Subset: IM |
Affiliation:
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Department of Physics, Arizona State University, Tempe 85287-1504. |
Export Citation:
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| MeSH Terms | |
Descriptor/Qualifier:
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Crystallography
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methods* Microscopy, Electron / methods* Platinum / chemistry Surface Properties* |
| Chemical | |
Reg. No./Substance:
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7440-06-4/Platinum |
From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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