| Nanomechanical characterization by double-pass force-distance mapping. | |
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MedLine Citation:
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PMID: 21673384 Owner: NLM Status: Publisher |
Abstract/OtherAbstract:
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We demonstrate high speed force-distance mapping using a double-pass scheme. The topography is measured in tapping mode in the first pass and this information is used in the second pass to move the tip over the sample. In the second pass, the cantilever dither signal is turned off and the sample is vibrated. Rapid (few kHz frequency) force-distance curves can be recorded with small peak interaction force, and can be processed into an image. Such a double-pass measurement eliminates the need for feedback during force-distance measurements. The method is demonstrated on self-assembled peptidic nanofibers. |
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Authors:
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Yavuz S Dagdas; M Necip Aslan; Ayse B Tekinay; Mustafa O Guler; Aykutlu Dâna |
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Publication Detail:
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Type: JOURNAL ARTICLE Date: 2011-6-15 |
Journal Detail:
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Title: Nanotechnology Volume: 22 ISSN: 1361-6528 ISO Abbreviation: - Publication Date: 2011 Jun |
Date Detail:
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Created Date: 2011-6-15 Completed Date: - Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 101241272 Medline TA: Nanotechnology Country: - |
Other Details:
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Languages: ENG Pagination: 295704 Citation Subset: - |
Affiliation:
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UNAM Institute of Materials Science and Nanotechnology, Bilkent University, 06800 Ankara, Turkey. |
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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