Document Detail


Minimizing pulling geometry errors in atomic force microscope single molecule force spectroscopy.
MedLine Citation:
PMID:  18641069     Owner:  NLM     Status:  MEDLINE    
Abstract/OtherAbstract:
In atomic force microscopy-based single molecule force spectroscopy (AFM-SMFS), it is assumed that the pulling angle is negligible and that the force applied to the molecule is equivalent to the force measured by the instrument. Recent studies, however, have indicated that the pulling geometry errors can drastically alter the measured force-extension relationship of molecules. Here we describe a software-based alignment method that repositions the cantilever such that it is located directly above the molecule's substrate attachment site. By aligning the applied force with the measurement axis, the molecule is no longer undergoing combined loading, and the full force can be measured by the cantilever. Simulations and experimental results verify the ability of the alignment program to minimize pulling geometry errors in AFM-SMFS studies.
Authors:
Monica Rivera; Whasil Lee; Changhong Ke; Piotr E Marszalek; Daniel G Cole; Robert L Clark
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Publication Detail:
Type:  Journal Article; Research Support, N.I.H., Extramural; Research Support, U.S. Gov't, Non-P.H.S.     Date:  2008-07-18
Journal Detail:
Title:  Biophysical journal     Volume:  95     ISSN:  1542-0086     ISO Abbreviation:  Biophys. J.     Publication Date:  2008 Oct 
Date Detail:
Created Date:  2008-09-25     Completed Date:  2008-11-17     Revised Date:  2013-06-05    
Medline Journal Info:
Nlm Unique ID:  0370626     Medline TA:  Biophys J     Country:  United States    
Other Details:
Languages:  eng     Pagination:  3991-8     Citation Subset:  IM    
Affiliation:
Department of Mechanical Engineering and Materials Science, Center for Biologically Inspired Materials and Materials Systems, Pratt School of Engineering, Duke University, Durham, North Carolina 27708, USA.
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MeSH Terms
Descriptor/Qualifier:
Artifacts*
Computer Simulation
DNA, Viral / chemistry
Dextrans / chemistry
Microscopy, Atomic Force*
Software
Spectrum Analysis / methods*
Surface Properties
Chemical
Reg. No./Substance:
0/DNA, Viral; 9004-54-0/Dextrans
Comments/Corrections

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