Document Detail


Losses and group index dispersion in insulator-on-silicon-on-insulator ridge waveguides.
MedLine Citation:
PMID:  20389471     Owner:  NLM     Status:  PubMed-not-MEDLINE    
Abstract/OtherAbstract:
We present polarization-dependent optical transmission properties of a completely symmetric silicon-on-insulator (SOI) microphotonic material system. In contrast to typical SOI based photonic materials, here an insulator-on-silicon-on-insulator (IOSOI) material system has been fabricated. This symmetric structure exhibits average losses between 1510 and 1630 nm of around 0.5 dB/mm for TE and 0.3 dB/mm for TM-polarization. The good transmission for TM-polarization can be explained by the thick insulting cladding layer of 3 microm thickness. Moreover, group index dispersion diagrams are presented and discussed for both polarizations.
Authors:
Daniel Pergande; Ralf B Wehrspohn
Publication Detail:
Type:  Journal Article; Research Support, Non-U.S. Gov't    
Journal Detail:
Title:  Optics express     Volume:  18     ISSN:  1094-4087     ISO Abbreviation:  Opt Express     Publication Date:  2010 Mar 
Date Detail:
Created Date:  2010-04-14     Completed Date:  2010-07-08     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  101137103     Medline TA:  Opt Express     Country:  United States    
Other Details:
Languages:  eng     Pagination:  4590-600     Citation Subset:  -    
Affiliation:
Institute of Physics, Martin-Luther-University Halle-Wittenberg, 06099 Halle, Germany. daniel.pergande@physik.uni-halle.de
Export Citation:
APA/MLA Format     Download EndNote     Download BibTex
MeSH Terms
Descriptor/Qualifier:

From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine


Previous Document:  Thin-film stack based integrated GRIN coupler with aberration-free focusing and super-high NA for ef...
Next Document:  Extraordinarily wide-view and wide spectral bandwidth transflective liquid-crystal displays.