| Losses and group index dispersion in insulator-on-silicon-on-insulator ridge waveguides. | |
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MedLine Citation:
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PMID: 20389471 Owner: NLM Status: PubMed-not-MEDLINE |
Abstract/OtherAbstract:
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We present polarization-dependent optical transmission properties of a completely symmetric silicon-on-insulator (SOI) microphotonic material system. In contrast to typical SOI based photonic materials, here an insulator-on-silicon-on-insulator (IOSOI) material system has been fabricated. This symmetric structure exhibits average losses between 1510 and 1630 nm of around 0.5 dB/mm for TE and 0.3 dB/mm for TM-polarization. The good transmission for TM-polarization can be explained by the thick insulting cladding layer of 3 microm thickness. Moreover, group index dispersion diagrams are presented and discussed for both polarizations. |
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Authors:
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Daniel Pergande; Ralf B Wehrspohn |
Publication Detail:
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Type: Journal Article; Research Support, Non-U.S. Gov't |
Journal Detail:
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Title: Optics express Volume: 18 ISSN: 1094-4087 ISO Abbreviation: Opt Express Publication Date: 2010 Mar |
Date Detail:
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Created Date: 2010-04-14 Completed Date: 2010-07-08 Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 101137103 Medline TA: Opt Express Country: United States |
Other Details:
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Languages: eng Pagination: 4590-600 Citation Subset: - |
Affiliation:
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Institute of Physics, Martin-Luther-University Halle-Wittenberg, 06099 Halle, Germany. daniel.pergande@physik.uni-halle.de |
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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