Document Detail


Longer term test-retest reliability of error-related brain activity.
MedLine Citation:
PMID:  21496055     Owner:  NLM     Status:  Publisher    
Abstract/OtherAbstract:
The error-related negativity (ERN) is a negative deflection in the event-related potential (ERP) following an erroneous response and is thought to reflect activity of the anterior cingulate cortex. There is accumulating evidence that the component has trait-like properties; prior evidence further suggests test-retest reliability estimates ranging from .40 to .82 over a period of 2 to 6 weeks. The present study examined temporal stability over a longer time period. Error-related brain activity was recorded from 26 subjects during an arrow version of the flankers task on two occasions separated by 1.5 to 2.5 years. Depending on the scoring method, test-retest reliability of the ERN ranged from .56 to .67. These data are consistent with previous suggestions that the ERN is a moderately stable, trait-like neural measure.
Authors:
Anna Weinberg; Greg Hajcak
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Publication Detail:
Type:  JOURNAL ARTICLE     Date:  2011-4-15
Journal Detail:
Title:  Psychophysiology     Volume:  -     ISSN:  1540-5958     ISO Abbreviation:  -     Publication Date:  2011 Apr 
Date Detail:
Created Date:  2011-4-18     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0142657     Medline TA:  Psychophysiology     Country:  -    
Other Details:
Languages:  ENG     Pagination:  -     Citation Subset:  -    
Copyright Information:
Copyright © 2011 Society for Psychophysiological Research.
Affiliation:
Department of Psychology, Stony Brook University, Stony Brook, New York, USA.
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