| Long-term aging of oscillators. | |
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MedLine Citation:
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PMID: 18263195 Owner: NLM Status: In-Data-Review |
Abstract/OtherAbstract:
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The authors report aging results for more than 40 oscillators, from a variety of sources, for periods ranging from 1 yr to more than 10 yr. The aging data were accumulated with an automated aging facility. The oscillators that have been tested include temperature-compensated crystal oscillators (TCXOs) and oven-controlled crystal oscillators (OCXOs). The TCXOs were maintained in a controlled temperature environment. Several of the TCXOs were built for a gun-launched sensor application and have been shown to be capable of surviving more than 30000-g shock levels of 12-ms duration. The aging results for these ruggedized TXCOs are surprisingly good (<2x10(-10)/d). The better OCXOs exhibit long term aging of a few parts in 10(12 )/d. |
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Authors:
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R L Filler; J R Vig |
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Publication Detail:
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Type: Journal Article |
Journal Detail:
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Title: IEEE transactions on ultrasonics, ferroelectrics, and frequency control Volume: 40 ISSN: 0885-3010 ISO Abbreviation: IEEE Trans Ultrason Ferroelectr Freq Control Publication Date: 1993 |
Date Detail:
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Created Date: 2008-02-11 Completed Date: - Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 9882735 Medline TA: IEEE Trans Ultrason Ferroelectr Freq Control Country: United States |
Other Details:
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Languages: eng Pagination: 387-94 Citation Subset: - |
Affiliation:
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US Army Res. Lab., Fort Monmouth, NJ. |
Export Citation:
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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