| Junction temperature measurement of light emitting diode by electroluminescence. | |
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MedLine Citation:
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PMID: 22225193 Owner: NLM Status: In-Data-Review |
Abstract/OtherAbstract:
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Junction temperature (JT) is a key parameter of the performance and lifetime of light emitting diodes (LEDs). In this paper, a mobile instrument system has been developed for the non-contact measurement of JTs of LED under LabVIEW control. The electroluminescence (EL) peak shift of the LED is explored to measure the JT. Commercially available high power blue LEDs are measured. A linear relation between emission peak shift and JT is found. The accuracy of the JT is about 1 °C determined by the precision of the emission peak shift, ±0.03 nm, at 3σ standard deviation for blue LED. Using this system, on-line temperature rise curves of LED lamps are determined. |
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Authors:
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S M He; X D Luo; B Zhang; L Fu; L W Cheng; J B Wang; W Lu |
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Publication Detail:
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Type: Journal Article |
Journal Detail:
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Title: The Review of scientific instruments Volume: 82 ISSN: 1089-7623 ISO Abbreviation: Rev Sci Instrum Publication Date: 2011 Dec |
Date Detail:
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Created Date: 2012-01-09 Completed Date: - Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 0405571 Medline TA: Rev Sci Instrum Country: United States |
Other Details:
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Languages: eng Pagination: 123101 Citation Subset: IM |
Affiliation:
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Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, Xiangtan University, Hunan Xiangtan 411105, ChinaNational Lab for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China. |
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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