Document Detail

High-pressure in situ structure measurement of low-Z noncrystalline materials with a diamond-anvil cell by an x-ray diffraction method.
MedLine Citation:
PMID:  20441349     Owner:  NLM     Status:  PubMed-not-MEDLINE    
We have developed techniques for high-pressure in situ structure measurement of low-Z noncrystalline materials with a diamond-anvil cell (DAC) by an x-ray diffraction method. Since the interaction between low-Z materials and x rays is small and the sample thickness in a DAC is also small, the incoherent scattering from the anvils overwhelms the coherent scattering from the sample at a high-Q range. By using a cubic boron nitride gasket to increase the sample thickness and the energy-dispersive x-ray diffraction method with a slit system to narrow the region from which detected x rays are scattered, we can reduce unfavorable effects of the incoherent scattering from the anvils and correct them accurately. We have successfully measured the structure factor of SiO(2) glass in a DAC over a relatively wide range of Q under high pressure.
Tomoko Sato; Nobumasa Funamori; Takumi Kikegawa
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  The Review of scientific instruments     Volume:  81     ISSN:  1089-7623     ISO Abbreviation:  Rev Sci Instrum     Publication Date:  2010 Apr 
Date Detail:
Created Date:  2010-05-05     Completed Date:  2010-07-27     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0405571     Medline TA:  Rev Sci Instrum     Country:  United States    
Other Details:
Languages:  eng     Pagination:  043906     Citation Subset:  -    
Institute for Solid State Physics, University of Tokyo, Kashiwa 277-8581, Japan.
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