Document Detail

High-pressure cell for neutron reflectometry of supercritical and subcritical fluids at solid interfaces.
MedLine Citation:
PMID:  22559577     Owner:  NLM     Status:  In-Data-Review    
A new high-pressure cell design for use in neutron reflectometry (NR) for pressures up to 50 MPa and a temperature range of 300-473 K is described. The cell design guides the neutron beam through the working crystal without passing through additional windows or the bulk fluid, which provides for a high neutron transmission, low scattering background, and low beam distortion. The o-ring seal is suitable for a wide range of subcritical and supercritical fluids and ensures high chemical and pressure stability. Wafers with a diameter of 5.08 cm (2 in.) and 5 mm or 10 mm thickness can be used with the cells, depending on the required pressure and momentum transfer range. The fluid volume in the sample cell is very small at about 0.1 ml, which minimizes scattering background and stored energy. The cell design and pressure setup for measurements with supercritical fluids are described. NR data are shown for silicon∕silicon oxide and quartz wafers measured against air and subsequently within the high-pressure cell to demonstrate the neutron characteristics of the high-pressure cell. Neutron reflectivity data for supercritical CO(2) in contact with quartz and Si∕SiO(2) wafers are also shown.
Justin R Carmichael; Gernot Rother; James F Browning; John F Ankner; Jose L Banuelos; Lawrence M Anovitz; David J Wesolowski; David R Cole
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  The Review of scientific instruments     Volume:  83     ISSN:  1089-7623     ISO Abbreviation:  Rev Sci Instrum     Publication Date:  2012 Apr 
Date Detail:
Created Date:  2012-05-07     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0405571     Medline TA:  Rev Sci Instrum     Country:  United States    
Other Details:
Languages:  eng     Pagination:  045108     Citation Subset:  IM    
Neutron Scattering Science Division, Oak Ridge National Laboratory, Tennessee 37831, USA.
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