| Gap thickness retrieval on air etalon by using a focused incoherent white-light beam. | |
| | |
MedLine Citation:
|
PMID: 21364724 Owner: NLM Status: In-Data-Review |
Abstract/OtherAbstract:
|
In a transmittance spectrum of air etalon composed of ITO-coated glass plates, stronger spectral modulation is observed by using a focused white-light incident beam compared with that by using a conventionally collimated beam. The light source is a single commercial light-emitting diode. An angular integrated multiple-beam Fabry-Perot model is proposed that is well fitted to the measured transmittance spectra. The gap thickness of the air etalon is sensitively retrieved and mapped at a lateral surface resolution of about 1 mm, and the unparallelness of the etalon angled as low as several microradians is thereafter estimated. |
| | |
Authors:
|
Bin Gao; Haihui Pu; Hongyue Gao; Dejin Yin; Jianhua Liu |
Related Documents
:
|
3656154 - The receptive-field spatial structure of cat retinal y cells. 17788234 - Proton radiography. 17026604 - Monocular and binocular thresholds for abruptly and gradually presented illusory contours. 11151984 - Precision, accuracy, and range of perceived achromatic transparency. 19146244 - Selective mechanisms for simple contours revealed by compound adaptation. 12226604 - Comparative bond strength of brackets cured using a pulsed xenon curing light with 2 di... |
Publication Detail:
|
Type: Journal Article |
Journal Detail:
|
Title: Applied optics Volume: 50 ISSN: 1539-4522 ISO Abbreviation: Appl Opt Publication Date: 2011 Mar |
Date Detail:
|
Created Date: 2011-03-02 Completed Date: - Revised Date: - |
Medline Journal Info:
|
Nlm Unique ID: 0247660 Medline TA: Appl Opt Country: United States |
Other Details:
|
Languages: eng Pagination: 1007-13 Citation Subset: IM |
Export Citation:
|
APA/MLA Format Download EndNote Download BibTex |
| MeSH Terms | |
Descriptor/Qualifier:
|
|
From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
Previous Document: Method for more accurate transmittance measurements of low-angle scattering samples using an integra...
Next Document: Mechanical stress measurement by an achromatic optical digital speckle pattern interferometry strain...