Document Detail


Extending the capability of STM break junction for conductance measurement of atomic-size nanowires: an electrochemical strategy.
MedLine Citation:
PMID:  18788809     Owner:  NLM     Status:  PubMed-not-MEDLINE    
Abstract/OtherAbstract:
The STM break junction (STM-BJ) and mechanically controllable break junction (MCBJ) are the two most widely applied techniques to fabricate atomic-size nanowires for conductance measurement. However, the drawbacks of the mechanical crashing between the two electrodes of the same material in these techniques hamper its capability of application in view of the variety of metals as well as the environment to perform the measurements. In this paper, we present an electrochemical strategy for STM-BJ by establishing a chemically well-defined metallic contact through a jump-to-contact mechanism between the tip and substrate of dissimilar metals, wherein the tip is in situ and electrochemically deposited with a thin film of a foreign metal of interest. The feasibility of the approach is demonstrated by taking Cu as a model system, followed by generalizing to Pd and Fe for which the conductance has been found otherwise difficult to measure at room temperature. The preferential point-contact conductance at 1, 0.9, and 0.86 G0 was measured for Cu, Pd, and Fe, respectively. The strategy present in this work not only extends the capability of STM-BJ to create a variety of metal nanowires including magnetic nanowires for further investigations but also provides opportunities to construct metal-molecule-metal junctions with a variety of choices of metals in the junctions.
Authors:
Xiao-Shun Zhou; Yi-Min Wei; Ling Liu; Zhao-Bin Chen; Jing Tang; Bing-Wei Mao
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Publication Detail:
Type:  Journal Article     Date:  2008-09-13
Journal Detail:
Title:  Journal of the American Chemical Society     Volume:  130     ISSN:  1520-5126     ISO Abbreviation:  J. Am. Chem. Soc.     Publication Date:  2008 Oct 
Date Detail:
Created Date:  2008-10-01     Completed Date:  2008-12-22     Revised Date:  2009-01-21    
Medline Journal Info:
Nlm Unique ID:  7503056     Medline TA:  J Am Chem Soc     Country:  United States    
Other Details:
Languages:  eng     Pagination:  13228-30     Citation Subset:  -    
Affiliation:
State Key Laboratory of Physical Chemistry of Solid Surfaces and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China.
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