| Electron holography with a Cs-corrected transmission electron microscope. | |
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MedLine Citation:
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PMID: 18096096 Owner: NLM Status: PubMed-not-MEDLINE |
Abstract/OtherAbstract:
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Cs correctors have revolutionized transmission electron microscopy (TEM) in that they substantially improve point resolution and information limit. The object information is found sharply localized within 0.1 nm, and the intensity image can therefore be interpreted reliably on an atomic scale. However, for a conventional intensity image, the object exit wave can still not be detected completely in that the phase, and hence indispensable object information is missing. Therefore, for example, atomic electric-field distributions or magnetic domain structures cannot be accessed. Off-axis electron holography offers unique possibilities to recover completely the aberration-corrected object wave with uncorrected microscopes and hence we would not need a Cs-corrected microscope for improved lateral resolution. However, the performance of holography is affected by aberrations of the recording TEM in that the signal/noise properties ("phase detection limit") of the reconstructed wave are degraded. Therefore, we have realized off-axis electron holography with a Cs-corrected TEM. The phase detection limit improves by a factor of four. A further advantage is the possibility of fine-tuning the residual aberrations by a posteriori correction. Therefore, a combination of both methods, that is, Cs correction and off-axis electron holography, opens new perspectives for complete TEM analysis on an atomic scale. |
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Authors:
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Dorin Geiger; Hannes Lichte; Martin Linck; Michael Lehmann |
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Publication Detail:
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Type: Journal Article; Research Support, Non-U.S. Gov't Date: 2007-12-21 |
Journal Detail:
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Title: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Volume: 14 ISSN: 1431-9276 ISO Abbreviation: Microsc. Microanal. Publication Date: 2008 Feb |
Date Detail:
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Created Date: 2008-01-21 Completed Date: 2008-06-03 Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 9712707 Medline TA: Microsc Microanal Country: United States |
Other Details:
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Languages: eng Pagination: 68-81 Citation Subset: - |
Affiliation:
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Institute for Structure Physics, Triebenberg Laboratory, Technische Universität Dresden, D-01062 Dresden, Germany. Dorin.Geiger@Triebenberg.de |
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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