Document Detail


Electrical breakdown of nanowires.
MedLine Citation:
PMID:  21967081     Owner:  NLM     Status:  Publisher    
Abstract/OtherAbstract:
The instantaneous electrical breakdown measurement of GaN and Ag nanowires are performed by in situ TEM method. Our results directly reveal the mechanism that typical semiconductor nanowires are thermally heated to be broken at the midpoint, while metallic nanowires are broken down near two ends due to the stress induced by electromigration. The different breakdown mechanisms for the nanowires are caused by the different thermal and electrical properties of materials.
Authors:
Jiong Zhao; Hongyu Sun; Sheng Dai; Yan Wang; Jing Zhu
Publication Detail:
Type:  JOURNAL ARTICLE     Date:  2011-10-3
Journal Detail:
Title:  Nano letters     Volume:  -     ISSN:  1530-6992     ISO Abbreviation:  -     Publication Date:  2011 Oct 
Date Detail:
Created Date:  2011-10-4     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  101088070     Medline TA:  Nano Lett     Country:  -    
Other Details:
Languages:  ENG     Pagination:  -     Citation Subset:  -    
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