| Effects of tilt on high-resolution ADF-STEM imaging. | |
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MedLine Citation:
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PMID: 18160220 Owner: NLM Status: PubMed-not-MEDLINE |
Abstract/OtherAbstract:
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A study of the effects of small-angle specimen tilt on high-resolution annular dark field images was carried out for scanning transmission electron microscopes with uncorrected and aberration-corrected probes using multislice simulations. The results indicate that even in the cases of specimen tilts of the order of 1 degree a factor of 2 reduction in the contrast of the high-resolution image should be expected. The effect holds for different orientations of the crystal. Calculations also indicate that as the tilted specimen gets thicker the contrast reduction increases. Images simulated with a low-angle annular dark field detector show that tilt effects are more pronounced in this case and suggest that these low-angle detectors can be used to correct specimen tilt during scanning transmission electron microscopes operation. |
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Authors:
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S E Maccagnano-Zacher; K A Mkhoyan; E J Kirkland; J Silcox |
Publication Detail:
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Type: Journal Article Date: 2007-11-13 |
Journal Detail:
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Title: Ultramicroscopy Volume: 108 ISSN: 0304-3991 ISO Abbreviation: Ultramicroscopy Publication Date: 2008 Jul |
Date Detail:
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Created Date: 2008-06-25 Completed Date: 2008-09-09 Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 7513702 Medline TA: Ultramicroscopy Country: Netherlands |
Other Details:
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Languages: eng Pagination: 718-26 Citation Subset: - |
Affiliation:
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School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA. |
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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