Document Detail

Dynamic control of adsorption sensitivity for photo-EMF-based ammonia gas sensors using a wireless network.
MedLine Citation:
PMID:  22346680     Owner:  NLM     Status:  PubMed-not-MEDLINE    
This paper proposes an adsorption sensitivity control method that uses a wireless network and illumination light intensity in a photo-electromagnetic field (EMF)-based gas sensor for measurements in real time of a wide range of ammonia concentrations. The minimum measurement error for a range of ammonia concentration from 3 to 800 ppm occurs when the gas concentration magnitude corresponds with the optimal intensity of the illumination light. A simulation with LabView-engineered modules for automatic control of a new intelligent computer system was conducted to improve measurement precision over a wide range of gas concentrations. This gas sensor computer system with wireless network technology could be useful in the chemical industry for automatic detection and measurement of hazardous ammonia gas levels in real time.
Yuriy Vashpanov; Hyunseung Choo; Dongsoo Stephen Kim
Publication Detail:
Type:  Journal Article; Research Support, Non-U.S. Gov't     Date:  2011-11-22
Journal Detail:
Title:  Sensors (Basel, Switzerland)     Volume:  11     ISSN:  1424-8220     ISO Abbreviation:  Sensors (Basel)     Publication Date:  2011  
Date Detail:
Created Date:  2012-02-20     Completed Date:  2012-07-12     Revised Date:  2013-05-29    
Medline Journal Info:
Nlm Unique ID:  101204366     Medline TA:  Sensors (Basel)     Country:  Switzerland    
Other Details:
Languages:  eng     Pagination:  10930-9     Citation Subset:  -    
Intelligent HCI Convergence Research Center, Sungkyunkwan University, 300, Cheoncheon-Dong, Jangan-Gu, Suwon, Gyenggi-Do, 440-746, Korea.
Export Citation:
APA/MLA Format     Download EndNote     Download BibTex
MeSH Terms

From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine

Previous Document:  Plasmonic nanostructures for nano-scale bio-sensing.
Next Document:  Alternative post-processing on a CMOS chip to fabricate a planar microelectrode array.