| Dravet syndrome: a technologist's perspective. | |
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MedLine Citation:
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PMID: 21313790 Owner: NLM Status: In-Process |
Abstract/OtherAbstract:
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Dravet Syndrome (DS), also known as Severe Myoclonic Epilepsy in Infancy (SMEI) is a rare, primarily genetic disorder which develops in infancy. The characteristics of DS are frequent, prolonged, primarily generalized seizures which occur initially with fever and eventually evolve to multiple afebrile seizure types such as myoclonic, atypical absence, and complex partial seizures. Patients, who are initially developmentally normal, will experience concomitant developmental regression as the syndrome progresses. Because it is a childhood disorder, DS is not well known outside the realm of pediatrics. An astute EEG technologist should be able to recognize key factors both clinically and electrographically which point suspicion to the diagnosis of Dravet Syndrome. |
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Authors:
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Patricia A Lordeon; Bilal Sitwat; Donna Brehm; Deborah Holder |
Publication Detail:
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Type: Journal Article |
Journal Detail:
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Title: American journal of electroneurodiagnostic technology Volume: 50 ISSN: 1086-508X ISO Abbreviation: Am J Electroneurodiagnostic Technol Publication Date: 2010 Dec |
Date Detail:
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Created Date: 2011-02-14 Completed Date: - Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 9607038 Medline TA: Am J Electroneurodiagnostic Technol Country: United States |
Other Details:
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Languages: eng Pagination: 297-312 Citation Subset: IM |
Affiliation:
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Children's Hospital of Pittsburgh of UPMC, Pittsburgh, Pennsylvania, USA. |
Export Citation:
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| MeSH Terms | |
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From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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