Document Detail

Direct measurement of the triplet exciton diffusion length in organic semiconductors.
MedLine Citation:
PMID:  22540725     Owner:  NLM     Status:  In-Data-Review    
We present a new method to measure the triplet exciton diffusion length in organic semiconductors. N,N^{'}-di-[(1-naphthyl)-N,N^{'}-diphenyl]-1,1^{'}-biphenyl)-4,4^{'}-diamine (NPD) has been used as a model system. Triplet excitons are injected into a thin film of NPD by a phosphorescent thin film, which is optically excited and forms a sharp interface with the NPD layer. The penetration profile of the triplet excitons density is recorded by measuring the emission intensity of another phosphorescent material (detector), which is doped into the NPD film at variable distances from the injecting interface. From the obtained triplet penetration profile we extracted a triplet exciton diffusion length of 87±2.7  nm. For excitation power densities >1  mW/mm^{2} triplet-triplet annihilation processes can significantly limit the triplet penetration depth into organic semiconductor. The proposed sample structure can be further used to study excitonic spin degree of freedom.
Oleksandr V Mikhnenko; Roald Ruiter; Paul W M Blom; Maria Antonietta Loi
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Publication Detail:
Type:  Journal Article     Date:  2012-03-29
Journal Detail:
Title:  Physical review letters     Volume:  108     ISSN:  1079-7114     ISO Abbreviation:  Phys. Rev. Lett.     Publication Date:  2012 Mar 
Date Detail:
Created Date:  2012-04-30     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  0401141     Medline TA:  Phys Rev Lett     Country:  United States    
Other Details:
Languages:  eng     Pagination:  137401     Citation Subset:  IM    
Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands and Dutch Polymer Institute, P.O. Box 902, 5600 AX, Eindhoven, The Netherlands.
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