Document Detail


Development and calibration of differential mobility analyzer for 20 to 80 nm particles under low pressure conditions.
MedLine Citation:
PMID:  22121701     Owner:  NLM     Status:  In-Process    
Abstract/OtherAbstract:
The vienna-type differential mobility analyzer (DMA) was developed for the measurement of wide-range nm-sized particles under low-pressure conditions (2.9-8 kPa) with the faraday cup electrometer (FCE). The length, inner and outer diameter of DMA are calculated as a function of flow rate, applied voltage, pressure, and particle diameter to avoide breakdown in DMA. The algorithm for the diffusion transfer function of the DMA was successfully developed and verified by comparing the numerical and experimental results. The DMA was calibrated via the tandem DMA (TDMA) method which using two DMA in parallel. The inversion algorithm was applied to the size distribution obtained from the current of the FCE. The calibration experiment was performed with 1% NaCl particles under atmospheric and low-pressure conditions. The calibration result showed that the development of the DMA was successful as it was able to measure 20- to 80-nm paricles under low-pressure conditions with various flow rates (0.1-0.5 l/min).
Authors:
Ji Hun Mun; Dae Guen Cho; Young Jin Kim; Jae Boong Choi; Sang Woo Kang; Ju Young Yun; Yong Hyeon Shin; Tae Sung Kim
Publication Detail:
Type:  Journal Article; Research Support, Non-U.S. Gov't    
Journal Detail:
Title:  Journal of nanoscience and nanotechnology     Volume:  11     ISSN:  1533-4880     ISO Abbreviation:  J Nanosci Nanotechnol     Publication Date:  2011 Jul 
Date Detail:
Created Date:  2011-11-29     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  101088195     Medline TA:  J Nanosci Nanotechnol     Country:  United States    
Other Details:
Languages:  eng     Pagination:  6275-82     Citation Subset:  IM    
Affiliation:
Sungkyunkwan Advanced Institute of Nano Technology, Sungkyunkwan University, Suwon 440-746, Republic of Korea.
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