Document Detail

Development of a Nanoindenter for In Situ Transmission Electron Microscopy.
MedLine Citation:
PMID:  12597795     Owner:  NLM     Status:  Publisher    
In situ transmission electron microscopy is an established experimental technique that permits direct observation of the dynamics and mechanisms of dislocation motion and deformation behavior. In this article, we detail the development of a novel specimen goniometer that allows real-time observations of the mechanical response of materials to indentation loads. The technology of the scanning tunneling microscope is adopted to allow nanometer-scale positioning of a sharp, conductive diamond tip onto the edge of an electron-transparent sample. This allows application of loads to nanometer-scale material volumes coupled with simultaneous imaging of the material's response. The emphasis in this report is qualitative and technique oriented, with particular attention given to sample geometry and other technical requirements. Examples of the deformation of aluminum and titanium carbide as well as the fracture of silicon will be presented.
Eric A. Stach; Tony Freeman; Andrew M. Minor; Doug K. Owen; John Cumings; Mark A. Wall; Tomas Chraska; Robert Hull; J.W. Morris; A. Jr ; Ulrich Zettl
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Publication Detail:
Journal Detail:
Title:  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada     Volume:  7     ISSN:  1435-8115     ISO Abbreviation:  Microsc. Microanal.     Publication Date:  2001 Nov 
Date Detail:
Created Date:  2003-Feb-24     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  9712707     Medline TA:  Microsc Microanal     Country:  -    
Other Details:
Languages:  ENG     Pagination:  507-517     Citation Subset:  -    
National Center for Electron Microscopy, Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720.
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