Document Detail


Depth-dependent anti-reflection and enhancement of luminescence from Si quantum dots-based multilayer on nano-patterned Si substrates.
MedLine Citation:
PMID:  21369157     Owner:  NLM     Status:  In-Data-Review    
Abstract/OtherAbstract:
Nano-sphere lithography technique was used to fabricate nano-patterned Si substrates with various depths by controlling the etching time. The depth-dependent broadband anti-reflection was observed and the reflectivity could be reduced to 5%. By depositing Si quantum dots/SiO<sub>2</sub> multilayer on nano-patterned substrate, the reflection was further suppressed and luminescence intensity was significantly enhanced. The luminescence enhancement is dependent of the etching depth and the luminescence can be one order of magnitude stronger than that on flat substrate due to both the improved absorption of excitation light and the increase of light extraction ratio by nano-patterned structures.
Authors:
Yu Liu; Jun Xu; Hongcheng Sun; Shenghua Sun; Wei Xu; Ling Xu; Kunji Chen
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  Optics express     Volume:  19     ISSN:  1094-4087     ISO Abbreviation:  Opt Express     Publication Date:  2011 Feb 
Date Detail:
Created Date:  2011-03-03     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  101137103     Medline TA:  Opt Express     Country:  United States    
Other Details:
Languages:  eng     Pagination:  3347-52     Citation Subset:  IM    
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