Document Detail

Crack surface extraction of industrial CT volume data using FPIT and planelet.
MedLine Citation:
PMID:  21422585     Owner:  NLM     Status:  In-Data-Review    
As an advanced nondestructive testing (NDT) technology, industrial computed tomography (ICT) has been widely applied to diversified areas. In modern industry, ICT is especially useful for analyzing inner defects of complex and close work pieces. The common defects of work pieces include gas cavities, slag inclusions, cracks and shrinking cavities. Only cracks are often caused by fatigue usage. Precisely extracting a crack is important to estimate the remaining secure service time of the work piece. This paper presents a crack surface extraction method of ICT volume data based on finite plane integral transform (FPIT) and planelet. FPIT and planelet, as new methods of multiscale geometric analysis (MGA), have distinct discrimination for different plane singularities. Within the paper, firstly the definitions of FPIT and planelet are introduced. Secondly, after analyzing the components and relationship of planelet at monoscale, a fast performance of planelet transform is designed. Thirdly, the steps of the proposed crack surface extraction method are described. In numeric experiment, compared with the method of 3D facet model, C-V model and 3D wavelet respectively, the proposed method can extract the crack surface full and continuously, which,is robust to noise.
Zongjian Li; Li Zeng; Xiaobing Zou; Caibing Xiang
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Publication Detail:
Type:  Journal Article    
Journal Detail:
Title:  Journal of X-ray science and technology     Volume:  19     ISSN:  1095-9114     ISO Abbreviation:  J Xray Sci Technol     Publication Date:  2011 Jan 
Date Detail:
Created Date:  2011-03-22     Completed Date:  -     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  9000080     Medline TA:  J Xray Sci Technol     Country:  Netherlands    
Other Details:
Languages:  eng     Pagination:  1-12     Citation Subset:  IM    
ICT Research Center, Key Laboratory of Optoelectronic Technology and System of the Education Ministry of China, Chongqing University, Chongqing, China College of Optoelectronic Engineering, Chongqing University, Chongqing, China.
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