Document Detail


Coupled lateral bending-torsional vibration sensitivity of atomic force microscope cantilever.
MedLine Citation:
PMID:  18054438     Owner:  NLM     Status:  PubMed-not-MEDLINE    
Abstract/OtherAbstract:
We study the influence of the contact stiffness and the ration between cantilever and tip lengths on the resonance frequencies and sensitivities of lateral cantilever modes. We derive expressions to determine both the effective resonance frequency and the mode sensitivity of an atomic force microscope (AFM) rectangular cantilever. Once the contact stiffness is given, the resonance frequency and the sensitivity of the vibration modes can be obtained from the expression. The results show that each mode has a different resonant frequency to variations in contact stiffness and each frequency increased until it eventually reached a constant value at very high contact stiffness. The low-order vibration modes are more sensitive to vibration than the high-order mode when the contact stiffness is low. However, the situation is reversed when the lateral contact stiffness became higher. Furthermore, increasing the ratio of tip length to cantilever length increases the vibration frequency and the sensitivity of AFM cantilever.
Authors:
Haw-Long Lee; Win-Jin Chang
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Publication Detail:
Type:  Journal Article     Date:  2007-11-01
Journal Detail:
Title:  Ultramicroscopy     Volume:  108     ISSN:  0304-3991     ISO Abbreviation:  Ultramicroscopy     Publication Date:  2008 Jul 
Date Detail:
Created Date:  2008-06-25     Completed Date:  2008-09-09     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  7513702     Medline TA:  Ultramicroscopy     Country:  Netherlands    
Other Details:
Languages:  eng     Pagination:  707-11     Citation Subset:  -    
Affiliation:
Department of Mechanical Engineering, Kun Shan University, Tainan, Taiwan.
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