Document Detail

Contrast and resolution enhancement of a near-field optical microscope by using a modulation technique.
MedLine Citation:
PMID:  15590137     Owner:  NLM     Status:  MEDLINE    
A new design of a tunneling near-field optical microscope (TNOM) combined with an atomic force microscope (AFM) is presented. This design can be used to generate three different images of the sample's surface: a non-contact (tapping mode) AFM image, a conventional TNOM and an image of a modulation signal of the conventional TNOM, which we call AC-TNOM. The images are obtained simultaneously, using a single light source. It is shown that the AC-TNOM has better resolution ( approximately 200A) and contrast compared to conventional TNOM ( approximately 400A).
Eli Flaxer; Eldad Palachi
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Publication Detail:
Type:  Comparative Study; Journal Article    
Journal Detail:
Title:  Ultramicroscopy     Volume:  102     ISSN:  0304-3991     ISO Abbreviation:  Ultramicroscopy     Publication Date:  2005 Jan 
Date Detail:
Created Date:  2004-12-13     Completed Date:  2005-02-22     Revised Date:  2006-11-15    
Medline Journal Info:
Nlm Unique ID:  7513702     Medline TA:  Ultramicroscopy     Country:  Netherlands    
Other Details:
Languages:  eng     Pagination:  141-9     Citation Subset:  IM    
School of Chemistry, The Sackler Faculty of Exact Sciences, Tel-Aviv University, Ramat Aviv, 69978 Tel-Aviv, Israel.
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MeSH Terms
Contrast Sensitivity
Microscopy, Atomic Force / instrumentation*
Microscopy, Scanning Tunneling / instrumentation*

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