Document Detail

Atomic vacancy-induced friction on the graphite surface: observation by lateral force microscopy.
MedLine Citation:
PMID:  12753093     Owner:  NLM     Status:  MEDLINE    
Lateral force microscopy has been employed to investigate the frictional behaviour of atomic vacancies on the graphite surface. Such a study was only made possible by the controlled expansion of originally single-atom vacancies into multiatom vacancies, employing oxygen plasma etching for this purpose. Enhanced friction was observed on the vacancy regions compared with pristine areas of graphite, the origin of which is examined and discussed.
J I Paredes; A Martínez-Alonso; J M D Tascón
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Publication Detail:
Type:  Journal Article; Research Support, Non-U.S. Gov't    
Journal Detail:
Title:  Journal of microscopy     Volume:  210     ISSN:  0022-2720     ISO Abbreviation:  J Microsc     Publication Date:  2003 May 
Date Detail:
Created Date:  2003-05-19     Completed Date:  2003-07-11     Revised Date:  2006-11-15    
Medline Journal Info:
Nlm Unique ID:  0204522     Medline TA:  J Microsc     Country:  England    
Other Details:
Languages:  eng     Pagination:  119-24     Citation Subset:  IM    
Instituto Nacional del Carbón, CSIC, Apartado 73, 33080 Oviedo, Spain.
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MeSH Terms
Graphite / chemistry*
Microscopy, Atomic Force* / instrumentation,  methods
Microscopy, Scanning Tunneling / instrumentation,  methods
Oxygen / chemistry
Time Factors
Reg. No./Substance:
7782-42-5/Graphite; 7782-44-7/Oxygen

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