| Atomic force microscopy observation of the enamel roughness and depth profile after phosphoric acid etching. | |
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MedLine Citation:
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PMID: 19692346 Owner: NLM Status: MEDLINE |
Abstract/OtherAbstract:
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The aim was to compare the enamel surface roughness (ESR) and absolute depth profile (ADP) (mean peak-to-valley height) by atomic force microscopy (AFM) before and after using four different phosphoric acids. A total of 160 enamel samples from 40 upper premolars were prepared. The inclusion criterion was that the teeth have healthy enamel. Exclusion criteria included any of the following conditions: facial restorations, caries lesions, enamel hypoplasia and dental fluorosis. Evaluations of the ESR and ADP were carried out by AFM. The Mann-Whitney U-test was used to compare continuous variables and the Wilcoxon test was used to analyze the differences between before and after etching. There were statistically significant differences (P <or= 0.05) among mean surface roughness and absolute depth before and after using four different phosphoric acids in healthy enamel; Etch-37 and Scotchbond Etching Gel showed higher profiles after etching (P <or= 0.05). There were statistically significant differences (P <or= 0.05) among roughness and ADP before and after using four different phosphoric acids in healthy enamel. However, consistently Etch-37 and Scotchbond Etching Gel showed the highest increase regarding the ESR and ADP after etching healthy enamel. AFM was a useful tool to study site-specific structural topography changes in enamel after phosphoric acid etching. |
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Authors:
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Juan Pablo Loyola-Rodriguez; Veronica Zavala-Alonso; Enrique Reyes-Vela; Nuria Patiño-Marin; Facundo Ruiz; Kenneth J Anusavice |
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Publication Detail:
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Type: Journal Article; Research Support, Non-U.S. Gov't Date: 2009-08-18 |
Journal Detail:
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Title: Journal of electron microscopy Volume: 59 ISSN: 1477-9986 ISO Abbreviation: J Electron Microsc (Tokyo) Publication Date: 2010 |
Date Detail:
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Created Date: 2010-04-12 Completed Date: 2010-07-19 Revised Date: - |
Medline Journal Info:
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Nlm Unique ID: 7611157 Medline TA: J Electron Microsc (Tokyo) Country: Japan |
Other Details:
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Languages: eng Pagination: 119-25 Citation Subset: IM |
Affiliation:
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San Luis Potosi University, Av. Dr. Manuel Nava S/N, Zona Universitaria, CP 78290, San Luis Potosi, México. jloyola@uaslp.mx |
Export Citation:
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| MeSH Terms | |
Descriptor/Qualifier:
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Acid Etching, Dental
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methods* Bicuspid / ultrastructure Dental Enamel / ultrastructure* Humans Microscopy, Atomic Force / methods Phosphoric Acids Surface Properties Tooth / ultrastructure* |
| Chemical | |
Reg. No./Substance:
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0/Phosphoric Acids; 7664-38-2/phosphoric acid |
From MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine
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