Document Detail


Advanced mask aligner lithography: new illumination system.
MedLine Citation:
PMID:  20940992     Owner:  NLM     Status:  PubMed-not-MEDLINE    
Abstract/OtherAbstract:
A new illumination system for mask aligner lithography is presented. The illumination system uses two subsequent microlens-based Köhler integrators. The second Köhler integrator is located in the Fourier plane of the first. The new illumination system uncouples the illumination light from the light source and provides excellent uniformity of the light irradiance and the angular spectrum. Spatial filtering allows to freely shape the angular spectrum to minimize diffraction effects in contact and proximity lithography. Telecentric illumination and ability to precisely control the illumination light allows to introduce resolution enhancement technologies (RET) like customized illumination, optical proximity correction (OPC) and source-mask optimization (SMO) in mask aligner lithography.
Authors:
Reinhard Voelkel; Uwe Vogler; Andreas Bich; Pascal Pernet; Kenneth J Weible; Michael Hornung; Ralph Zoberbier; Elmar Cullmann; Lorenz Stuerzebecher; Torsten Harzendorf; Uwe D Zeitner
Publication Detail:
Type:  Journal Article; Research Support, Non-U.S. Gov't    
Journal Detail:
Title:  Optics express     Volume:  18     ISSN:  1094-4087     ISO Abbreviation:  Opt Express     Publication Date:  2010 Sep 
Date Detail:
Created Date:  2010-10-13     Completed Date:  2011-02-02     Revised Date:  -    
Medline Journal Info:
Nlm Unique ID:  101137103     Medline TA:  Opt Express     Country:  United States    
Other Details:
Languages:  eng     Pagination:  20968-78     Citation Subset:  -    
Affiliation:
SUSS MicroOptics SA, Jaquet-Droz 7, 2000 Neuchâtel, Switzerland. voelkel@suss.ch
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